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EM-KLEEN
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PIE plasma cleaners EM-KLEEN

Product Details


Used for SEM, FIB, XPS and ALD vacuum analysis and coating equipment for hydrocarbon contamination cleaning, supporting ZEISS, HITACHI, JEOL, FEI, TESCAN, SPECS systems.


Technical specifications


Working pressure:  sample chamber: 0.1-2.5 mTorr, compatible with molecular pump

Power Supply:       13.56MHz 75Wattt RF 




Product appearance




Application example 


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